Tag
fault-models
- Oct 28, 2025 Scan Chains and Automatic Test Pattern Generation Why a flip-flop becomes a two-mode scan cell, how a stuck-at fault model turns testing into a search for input patterns, and what the ATPG tool trades away when it cannot fill the vector. hardware engineering
- Mar 26, 2025 Why Byzantine Fault Tolerance Costs a Third of the Cluster The 3f+1 bound, where it comes from, and how quorum sizes must change when a faulty node can lie rather than merely stop. distributed systems