Tag
redundancy
- May 31, 2026 Yield Models That Turn Defect Density into Die Cost The Poisson and negative binomial yield formulas, why clustering makes the Poisson model pessimistic, and how die area, redundancy, and wafer size set the cost of a working part. hardware engineering
- Apr 11, 2026 Self-Healing Reads: Reconstructing a Copy From Redundancy How a filesystem repairs a damaged block during a read, what the repair costs on mirrored and parity layouts, and why the repair itself can fail. filesystems
- Feb 20, 2026 Memory Redundancy and Repair: Turning Defective Arrays into Working Parts How spare rows and columns, fuse or antifuse programming, and built-in self-repair convert a memory array with dozens of defects into a passing die, and when the spare budget runs out. hardware engineering
- Jun 25, 2025 Common-Cause Failure and What Design Diversity Actually Buys Why two identical channels fail together more often than independence predicts, how beta factors enter the reliability calculation, and which kinds of diversity reduce the shared term. embedded systems
- Aug 1, 2023 Voting Redundancy and Average Probability of Failure on Demand How 1-out-of-2 and 2-out-of-3 architectures change the PFD calculation, why the common-cause term dominates the result, and what a voter must do when its channels disagree. embedded systems