Tag
test-coverage
- Oct 28, 2025 Scan Chains and Automatic Test Pattern Generation Why a flip-flop becomes a two-mode scan cell, how a stuck-at fault model turns testing into a search for input patterns, and what the ATPG tool trades away when it cannot fill the vector. hardware engineering
- Aug 21, 2025 Wafer Probe and the Economics of Test Coverage How a probe card makes contact with pads a few tens of micrometres wide, why test time is a fab cost, and how the choice of coverage trades probe cost against escape rate and package cost. hardware engineering